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Journal:JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

Correspondence Author:HW

Indexed by:Article

Volume:30

Issue:9

Page Number:1970-1979

Translation or Not:no

Pre One:Depth profiling of nanometer thin layers by pulsed micro-discharge with inductively coupled plasma mass spectrometry Next One:Composition analysis of ancient celadon via femtosecond laser ionization time-of-flight mass spectrometry