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Surface bonding on silicon surfaces as probed by tip-enhanced Raman spectroscopy
Release time:2022-03-11 Hits:
Journal:
Science China-Chemistry
Indexed by:
Article
Correspondence Author:
RB
Volume:
53
Issue:
2
Page Number:
426-431
Translation or Not:
no
Date of Publication:
2009-12-02
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New strategies for surface-enhanced Raman scattering at transition-metal interfaces: Thickness-dependent characteristics of electrodeposited Pt-group films on gold and carbon
Next One:
In-situ SERS of piperonal and isosafrole electrooxidation on Pt electrode