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Surface Ramam spectropscopy for in situ investigating silicon etching process
Release time:2022-03-11 Hits:
Journal:
Spectroscopy and Spectral Analysis
Co-author:
RB
Volume:
20
Issue:
6
Page Number:
833-5
Translation or Not:
no
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The electrochemical halogenation of benzene: an in situ confocal microprobe Raman study
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In situ photoluminescence studies of silicon surfaces during photoelectrochemical etching processes
