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Journal:Analytical Chemistry

Correspondence Author:YXM

Co-author:HW

Indexed by:Journal article (JA)

Volume:89

Issue:18

Page Number:9857-9863

Translation or Not:no

Date of Publication:2017-09-19

Pre One:Depth profiling of nanometer thin layers by laser desorption and laser postionization time-of-flight mass spectrometry Next One:Direct and comprehensive analysis of dyes based on integrated molecular and structural information via laser desorption laser postionization mass spectrometry