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Paper Publications

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Depth profiling of nanometer thin layers by laser desorption and laser postionization time-of-flight mass spectrometry

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Journal:Journal of Analytical Atomic Spectrometry

Correspondence Author:HW

Indexed by:Journal article (JA)

Volume:32

Issue:10

Page Number:1878-1884

Translation or Not:no

Date of Publication:2016-10-31