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Influence of annealing ambience on the formation of cobalt silicides
Release time:2022-03-11 Hits:
Journal:
Chemical Physics Letters
Indexed by:
Article
Correspondence Author:
RB
Volume:
372
Page Number:
15-21
Translation or Not:
no
Date of Publication:
2003-04-22
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Surface Ramam spectrpscopy for in situ investigating silicon etching process
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Enhanced Raman Scattering by Polystyrene Microspheres and Application for Detecting Molecules Adsorbed on Au Single Crystal Surface